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2D Poisson-Schrodinger simulations in ultra-thin silicon-on-nothing devices: quantum effects impact evaluation

Authors :
Stephane Monfray
Abdelkader Souifi
D. Chanemougame
D. Delille
Francois Leverd
T. Skotnicki
H. Bourdon
Alexandre Talbot
A. Poncet
Source :
2004 IEEE International SOI Conference (IEEE Cat. No.04CH37573).
Publication Year :
2005
Publisher :
IEEE, 2005.

Abstract

We present results of simulations on silicon-on-nothing (SON) devices featuring ultra-thin Si channels. The simulations are based on QUANTIX, a 2D-Finite Element solver, and consequently fully account for quantization effects. Quantum simulations demonstrate the impact of carriers confinement in very thin Si conduction channel, therefore leading on a substantial threshold voltage increase, up to 350 mV from TSi=10 to 1 nm. Experimental data from SON devices featuring ultra-thin (

Details

Database :
OpenAIRE
Journal :
2004 IEEE International SOI Conference (IEEE Cat. No.04CH37573)
Accession number :
edsair.doi...........97168af7bc370cd8c05dbd33263693cb
Full Text :
https://doi.org/10.1109/soi.2004.1391563