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Ultra-low noise and exceptional uniformity of SensL C-series SiPM sensors
- Source :
- SPIE Proceedings.
- Publication Year :
- 2015
- Publisher :
- SPIE, 2015.
-
Abstract
- SensL C-Series Silicon Photomultiplier (SiPM) sensors are fabricated in a high-volume CMOS foundry to a custom SensL process, and packaged as a reflow solderable surface mount device. Advances in SiPM production have resulted in significant improvement in PDE, dark current as well as tighter breakdown voltage uniformity for the C-Series SiPM sensors. The SiPM are fabricated with a shallow P-on-N junction optimized for the detection of shorter wavelength photons, with a peak PDE of 41% at 420nm and excellent sensitivity extending to wavelengths
Details
- ISSN :
- 0277786X
- Database :
- OpenAIRE
- Journal :
- SPIE Proceedings
- Accession number :
- edsair.doi...........9631027292075c7130d86e6be0d021a0
- Full Text :
- https://doi.org/10.1117/12.2076898