Test equipment considerations for time domain SVSWR measurements

Authors :: Werner Schaefer
Source :: 2017 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI).
Publication Year :: 2017
Publisher :: IEEE, 2017.
Abstract: Vector Network Analyzer Settings for TD Measurements. Gating: The unwanted time domain responses will be reduced by the gate, but not totally removed. Even the most simple impulse response does not appear at a single point in time, but can spread out and have side lobe ripples that cannot be completely eliminated by gating.

Subjects :: Test equipment
Side lobe
Computer science
Acoustics
Frequency domain
Electronic engineering
Time domain
Gating
Single point
Impulse response

Database :: OpenAIRE
Journal :: 2017 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI)
Accession number :: edsair.doi...........94fbf226e95016bebecf86e661226cc8
Full Text :: https://doi.org/10.1109/isemc.2017.8078057