Scanning Tunnelling Microscopy

Since its introduction by Binnig et al.,(1) the Scanning Tunnelling Microscope (STM) has engendered much excitement among surface scientists, not only for the atomically resolved surface topography it can achieve, but also for the range of surface spectroscopy possible. In this chapter we discuss scanning tunnelling microscopy in the context of the study of thin films (for example, an organic adsorbate on a metal substrate), highlighting the strengths and weaknesses of the technique. Greater detail may be found in the literature; in particular, the review by Hansma and Tersof(2) provides a wide survey of the field. For more general reviews of tunnelling and tunnelling spectroscopy the reader is directed to the books by Wol(3) and Hansma.(4)