Microscope equipped with graphene-oxide-semiconductor electron source

We propose the scanning electron microscope (SEM) using the graphene-oxide-semiconductor type planar electron emission device as an electron source. Graphene/Oxide/Semiconductor (GOS) structure realizes very high electron emission efficiency of over 30 % and it can be operated in low vacuum condition and low applied voltage. Therefore, SEM using the GOS electron source can eliminate several condenser lenses from the electron optics which are needed in the conventional SEM due to the very small divergence angle of the electron beams emitted from the flat surface. In this study, we installed the GOS type electron source into the conventional SEM and successfully obtained the stable SEM image with a probe current of 20 pA without noise using GOS electron source. In addition, we found the optimal electron optics for the parallel electron beams with a very small divergence angle of approximately 0 degree by the simulation of the electron beam trajectory.