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STUDY ON ULTRA THIN AlGaAs LAYER ON GaAs

Authors :
Wan Ming-Fang
Zha Fang-Xing
Liu Xing-Quan
Qiao Yi-Min
Shen Xue-Chu
Chen Xiao-Shuang
Yan Li-Ping
Lu Wei
Mu Yao-Ming
Source :
Acta Physica Sinica. 46:1613
Publication Year :
1997
Publisher :
Acta Physica Sinica, Chinese Physical Society and Institute of Physics, Chinese Academy of Sciences, 1997.

Abstract

A Series of samples of ultra thin AlGaAs films grown on GaAs(100) substrate by MBE are studied by photomodulated reflectance (PR)spectroscopy in ultra high vacuum chamber.More than one peak are observed for samples with thickness less than 35nm,but only one peak is observed for 100nm thick sample,The position and width of these peaks change with sample thickness.The experimental results are well explained by step potential model.

Details

ISSN :
10003290
Volume :
46
Database :
OpenAIRE
Journal :
Acta Physica Sinica
Accession number :
edsair.doi...........92ed6b99d66c0ad9963073842068ca4a