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Interaction Between Random Telegraph Noise and Hot Carrier Ageing

Authors :
Zhigang Ji
Azrif Manut
Jian Fu Zhang
Weidong Zhang
Source :
2019 China Semiconductor Technology International Conference (CSTIC).
Publication Year :
2019
Publisher :
IEEE, 2019.

Abstract

As downscaling reaches nanometer scale, Hot Carrier Ageing (HCA) and Random Telegraphy Noise (RTN) are two important sources of device instability. Early works typically investigate them separately and treat them as independent phenomena. In reality, however, they occur simultaneously in a device and their interaction is not fully understood. In this work, we study the impact of HCA on RTN amplitude. It is found that for devices of average RTN, HCA only has a limited effect on RTN. For devices of abnormally high RTN, however, HCA can substantially reduce the RTN. The underlying physical mechanism is explored.

Details

Database :
OpenAIRE
Journal :
2019 China Semiconductor Technology International Conference (CSTIC)
Accession number :
edsair.doi...........92578ffaeebf6636d7672e62432a4386