Characterizing Plasma-exposed In0.52Al0.48As Surface Using Photoreflectance-, Raman-, and Photoluminescence Spectra Method

MLA

C. W. Kuo, et al. “Characterizing Plasma-Exposed In0.52Al0.48As Surface Using Photoreflectance-, Raman-, and Photoluminescence Spectra Method.” Crystal Research and Technology, vol. 31, Jan. 1996, pp. 119–25. EBSCOhost, https://doi.org/10.1002/crat.2170310119.

APA

C. W. Kuo, G. C. Jiang, Y. D. Juang, & Y. Chang. (1996). Characterizing Plasma-exposed In0.52Al0.48As Surface Using Photoreflectance-, Raman-, and Photoluminescence Spectra Method. Crystal Research and Technology, 31, 119–125. https://doi.org/10.1002/crat.2170310119

Chicago

C. W. Kuo, G. C. Jiang, Y. D. Juang, and Y. Chang. 1996. “Characterizing Plasma-Exposed In0.52Al0.48As Surface Using Photoreflectance-, Raman-, and Photoluminescence Spectra Method.” Crystal Research and Technology 31 (January): 119–25. doi:10.1002/crat.2170310119.