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Analytical transmission line model for complex dielectric constant measurement of thin substrates using T‐resonator method
- Source :
- IET Microwaves, Antennas & Propagation. 14:2027-2034
- Publication Year :
- 2020
- Publisher :
- Institution of Engineering and Technology (IET), 2020.
-
Abstract
- This work presents a new analytical transmission line model for microstrip T-resonator dielectric constant measurement method in order to simplify the extraction of the complex dielectric permittivity of the substrate and increase its accuracy. The proposed new formula, which is based on the T -matrix equivalent circuit of the structure, is only dependent on the propagation and attenuation constants of the stub line. Two new formulas to determine the end effect of open-ended stub and the propagation constant parameters are also presented. As an example, a T-resonator is implemented on a 31 mil RO4003C substrate, and it is simulated and measured S-parameter results in the range of 1 MHz–8 GHz are used to calculate a complex dielectric constant of the substrate at each resonance frequency. A full-wave simulation is also used to confirm the accuracy of the proposed model. The comparison between the simulated and the measured S-parameters demonstrates a relative error of
- Subjects :
- Permittivity
Materials science
Attenuation
020208 electrical & electronic engineering
020206 networking & telecommunications
02 engineering and technology
Dielectric
Microstrip
Computational physics
Stub (electronics)
Transmission line
0202 electrical engineering, electronic engineering, information engineering
Equivalent circuit
Electrical and Electronic Engineering
Propagation constant
Subjects
Details
- ISSN :
- 17518733 and 17518725
- Volume :
- 14
- Database :
- OpenAIRE
- Journal :
- IET Microwaves, Antennas & Propagation
- Accession number :
- edsair.doi...........9133e574e5e143451d794f23367518b9