A Deep Learning Method for Printing Defect Detection

Authors :: Jing Li
Xiaoli Bai
Jie Pan
Quanhui Tian
Wanying Fu
Zhaohui Jing
Source :: 2022 IEEE 4th International Conference on Power, Intelligent Computing and Systems (ICPICS).
Publication Year :: 2022
Publisher :: IEEE, 2022.

Database :: OpenAIRE
Journal :: 2022 IEEE 4th International Conference on Power, Intelligent Computing and Systems (ICPICS)
Accession number :: edsair.doi...........90f449a737f5b134138f17f88215530f
Full Text :: https://doi.org/10.1109/icpics55264.2022.9873703