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Preparation and characterization of AgGaS2 thin films by vacuum evaporation
- Source :
- Journal of Crystal Growth. 167:151-156
- Publication Year :
- 1996
- Publisher :
- Elsevier BV, 1996.
-
Abstract
- AgGaS 2 thin films have been prepared by the vacuum evaporation method on GaAs(100). Elemental silver, gallium and sulfur have been used as the source materials. The X-ray diffraction and the RHEED analysis show that the good epitaxial films with the c -axis normal to the GaAs(100) substrate are grown for the stoichiometric composition. The non-stoichiometric films show that the two different orientational types coexist in a film. One type is that the c -axis is normal to the substrate. The other type is that the c -axis is parallel to the two a -axes of GaAs.
- Subjects :
- Diffraction
Reflection high-energy electron diffraction
Analytical chemistry
chemistry.chemical_element
Mineralogy
Substrate (electronics)
Condensed Matter Physics
Epitaxy
Characterization (materials science)
Vacuum evaporation
Inorganic Chemistry
chemistry
Materials Chemistry
Gallium
Thin film
Subjects
Details
- ISSN :
- 00220248
- Volume :
- 167
- Database :
- OpenAIRE
- Journal :
- Journal of Crystal Growth
- Accession number :
- edsair.doi...........909b84d7ec65cd9b9f2f2caa1c0518f5
- Full Text :
- https://doi.org/10.1016/0022-0248(96)00147-9