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Electronic stopping in molecular dynamics simulations of cascades in 3C–SiC
- Source :
- Journal of Nuclear Materials. 540:152371
- Publication Year :
- 2020
- Publisher :
- Elsevier BV, 2020.
-
Abstract
- We investigate the effect of the electronic stopping power on defect production due to ion irradiation of cubic silicon carbide using molecular dynamics simulations. We simulate 20 keV and 30 keV Si and C ions, with and without the electronic energy loss. The results show that the electronic stopping effects are more profound in the case of C irradiation, where the ratio of the electronic energy loss S e to the nuclear energy loss S n is much larger compared to the ratio for Si ions. These findings indicate that this ratio plays a role in the effect of the electronic stopping on ion irradiation.
- Subjects :
- Nuclear and High Energy Physics
Materials science
Physics::Instrumentation and Detectors
02 engineering and technology
equipment and supplies
021001 nanoscience & nanotechnology
01 natural sciences
Molecular physics
010305 fluids & plasmas
Ion
chemistry.chemical_compound
Molecular dynamics
Nuclear Energy and Engineering
chemistry
0103 physical sciences
Radiation damage
Silicon carbide
Electronic effect
Stopping power (particle radiation)
General Materials Science
Irradiation
0210 nano-technology
Electronic energy
Subjects
Details
- ISSN :
- 00223115
- Volume :
- 540
- Database :
- OpenAIRE
- Journal :
- Journal of Nuclear Materials
- Accession number :
- edsair.doi...........904faf10554072c5a69384debd5e485b
- Full Text :
- https://doi.org/10.1016/j.jnucmat.2020.152371