Cite

Relationship between texture and electromigration lifetime in sputtered AI-1% Si thin films

MLA

D. B. Knorr, et al. “Relationship between Texture and Electromigration Lifetime in Sputtered AI-1% Si Thin Films.” Journal of Electronic Materials, vol. 22, June 1993, pp. 589–96. EBSCOhost, https://doi.org/10.1007/bf02666403.



APA

D. B. Knorr, Russell E. Mikawa, & Ann N. Campbell. (1993). Relationship between texture and electromigration lifetime in sputtered AI-1% Si thin films. Journal of Electronic Materials, 22, 589–596. https://doi.org/10.1007/bf02666403



Chicago

D. B. Knorr, Russell E. Mikawa, and Ann N. Campbell. 1993. “Relationship between Texture and Electromigration Lifetime in Sputtered AI-1% Si Thin Films.” Journal of Electronic Materials 22 (June): 589–96. doi:10.1007/bf02666403.