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Interfacial reaction and reliability of high temperature die attach solders for power electronics

Authors :
Hwang How Yuan
Rhee Min Woo Daniel
Lee Jong Bum
Pan Wei Chih
Source :
2015 IEEE 17th Electronics Packaging and Technology Conference (EPTC).
Publication Year :
2015
Publisher :
IEEE, 2015.

Abstract

Lead-free solder alloys for high temperature applications is required to meet increasing demands for reliable replacements for lead-based alloys. Especially, high temperature solder is required for bonding in power electronics packages where first bonding on a lead-frame is performed at a temperature of about 330 °C. In this study, the SiC based TO-220 power package was developed by applying high temperature endurable material sets which can endure over 220°C device junction temperature. The interfacial reaction and reliability of SiC die attachment on and Ni plated lead frames using Zn-Al based solder was investigated. Zn-Al-Ge solder alloy showed good temperature tolerance after temperature cycle (TC), high temperature storage test whereas Zn-Al-Ge-Mg solder alloy showed failures after TC test.

Details

Database :
OpenAIRE
Journal :
2015 IEEE 17th Electronics Packaging and Technology Conference (EPTC)
Accession number :
edsair.doi...........8edaca5392fbfee5f61c7685b74b1c07
Full Text :
https://doi.org/10.1109/eptc.2015.7412304