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Defect and dopant properties of the oxyfluoride superconductorSr2CuO2F2+δs
- Source :
- Physical Review B. 55:3141-3145
- Publication Year :
- 1997
- Publisher :
- American Physical Society (APS), 1997.
-
Abstract
- Computer simulation techniques are used to investigate the defect and dopant properties of the oxyfluoride superconductor, Sr{sub 2}CuO{sub 2}F{sub 2+{delta}}. The observed La{sub 2}CuO{sub 4}-type structure is correctly reproduced by our interatomic potential model. Defect calculations find that the most favorable fluorine interstitial position is near the ideal site and is associated with significant local relaxation, in accord with diffraction studies. A variety of redox reactions relevant to high-T{sub c} behavior have been examined. Our results confirm that oxidation, involving fluorine incorporation at interstitial sites, is the most favorable process to introduce the holes necessary for superconductivity. We also consider the energetics of a range of dopant substitutions (alkali and alkaline-earth ions) at the Sr site. {copyright} {ital 1997} {ital The American Physical Society}
Details
- ISSN :
- 10953795 and 01631829
- Volume :
- 55
- Database :
- OpenAIRE
- Journal :
- Physical Review B
- Accession number :
- edsair.doi...........8ec3c48e539dde4592b0d3bbb1f6ccdf