Nanomaterials produced by laser ablation techniques, Part II: High spatially resolved nondestructive characterization of nanostructures

We studied nanoparticles by several high resolution microscopic methods as scanning electron microscopy (SEM), transmission electron microscopy (TEM) and scanning probe techniques especially atomic force microscopy (AFM) in contact and non-contact mode. While AFM in non-contact mode gives reliable information for 100 nm range nanoparticles it fails for smaller particles, showing lack of reproducibility. TEM and SEM prove to be reliable. By SEM imaging the agglomeration behavior and the structure of agglomerates are discussed in detail.