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Analytical studies of vertical double gate NTFET

Authors :
S. Krishnapriya
Rama Komaragiri
Source :
2014 International Conference on Electronics and Communication Systems (ICECS).
Publication Year :
2014
Publisher :
IEEE, 2014.

Subjects

Subjects :
Materials science
business.industry
Gate oxide
Electrical engineering
Optoelectronics
Double gate
Time-dependent gate oxide breakdown
business

Details

Database :
OpenAIRE
Journal :
2014 International Conference on Electronics and Communication Systems (ICECS)
Accession number :
edsair.doi...........8d8015ff86fc07c6801bb2a9c58bf034

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