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Banding defect detection and image quality classification

Authors :
Yi Yang
Jan P. Allebach
Yousun Bang
Eric Maggard
Min-ki Cho
Source :
Electronic Imaging. 33:245-1
Publication Year :
2021
Publisher :
Society for Imaging Science & Technology, 2021.

Subjects

Subjects :
Image quality
Computer science
business.industry
Pattern recognition
Artificial intelligence
business

Details

ISSN :
24701173
Volume :
33
Database :
OpenAIRE
Journal :
Electronic Imaging
Accession number :
edsair.doi...........8d2f9d75418ccf5367e4c0989940508a

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