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Property of Tin Oxide Film Formed on Tin-Plated Connector Contacts

Authors :
Shigeru Sawada
Terutaka Tamai
Yasuhiro Hattori
Yuya Nabeta
Source :
2010 Proceedings of the 56th IEEE Holm Conference on Electrical Contacts.
Publication Year :
2010
Publisher :
IEEE, 2010.

Subjects

Subjects :
Cable gland
Materials science
chemistry
Contact resistance
Metallurgy
chemistry.chemical_element
Thin film
Tin
Tin oxide
Temperature measurement
Electrical contacts
Sheet resistance

Details

Database :
OpenAIRE
Journal :
2010 Proceedings of the 56th IEEE Holm Conference on Electrical Contacts
Accession number :
edsair.doi...........8caf5a3f36ebc051cf5a43c0f7e598e5
Full Text :
https://doi.org/10.1109/holm.2010.5619529
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