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Testing Technologies for Analog/Mixed-Signal Circuits in IoT Era

Authors :
Yujie Zhao
Haruo Kobayashi
Nobukazu Tsukiji
Jianglin Wei
Anna Kuwana
Source :
IEEJ Transactions on Electronics, Information and Systems. 141:1-12
Publication Year :
2021
Publisher :
Institute of Electrical Engineers of Japan (IEE Japan), 2021.

Subjects

Subjects :
business.industry
Computer science
Electrical engineering
Mixed-signal integrated circuit
Electrical and Electronic Engineering
Internet of Things
business

Details

ISSN :
13488155 and 03854221
Volume :
141
Database :
OpenAIRE
Journal :
IEEJ Transactions on Electronics, Information and Systems
Accession number :
edsair.doi...........8c69768d26b8fa9315bb4e6fd660b109
Full Text :
https://doi.org/10.1541/ieejeiss.141.1
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