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Broadening the IF Band of a THz Hot-Electron Bolometer Mixer by Using a Magnetic Thin Film
- Source :
- IEEE Transactions on Terahertz Science and Technology. 8:647-653
- Publication Year :
- 2018
- Publisher :
- Institute of Electrical and Electronics Engineers (IEEE), 2018.
-
Abstract
- To expand the intermediate frequency (IF) band and improve the sensitivity of a hot-electron bolometer mixer (HEBM), we proposed and examined a new HEBM structure using a magnetic thin film. We found that it was possible to suppress the superconductivity of the 5-nm-thick niobium nitride (NbN) thin film by the addition of a 1.8-nm-thick nickel (Ni) thin film. It was also confirmed that the superconductivity disappeared in the Au (70 nm)/Ni (1.8 nm)/NbN (5 nm) trilayer for forming the electrodes of the HEBM. By using the magnetic thin film for the electrodes, we suggested that the superconductivity of the HEBM strip would be affected and that hot spots would be formed near the electrodes. This approach is effective for shortening the hot-electron drift length and will lead to the expansion of the IF bandwidth. We think that the new structure lowers the required local oscillator power and improves the HEBM sensitivity by suppressing the proximity effect under the electrode. The IF bandwidth of the fabricated Ni-HEBMs was evaluated at 1.9 THz. We confirmed that the IF bandwidth expands, and the evaluated bandwidths were in the range of 5.1–5.7 GHz at 4 K. Ni-HEBMs with 0.1-μm strip length were also fabricated and evaluated. The IF bandwidth was about 6.9 GHz at 4 K.
- Subjects :
- Superconductivity
Radiation
Niobium nitride
Materials science
Terahertz radiation
business.industry
Local oscillator
Bolometer
02 engineering and technology
021001 nanoscience & nanotechnology
01 natural sciences
law.invention
chemistry.chemical_compound
chemistry
Intermediate frequency
law
0103 physical sciences
Electrode
Optoelectronics
Electrical and Electronic Engineering
Thin film
010306 general physics
0210 nano-technology
business
Subjects
Details
- ISSN :
- 21563446 and 2156342X
- Volume :
- 8
- Database :
- OpenAIRE
- Journal :
- IEEE Transactions on Terahertz Science and Technology
- Accession number :
- edsair.doi...........8b5c9610b78a8d964b8c3735eb145e4a
- Full Text :
- https://doi.org/10.1109/tthz.2018.2874355