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On the paper 'Mechanism of thermal runaway as a cause of Fleischmann-Pons effect,' by N.E. Galushkin et al. Published in the Journal of Electroanalytical Chemistry, 870, pp. 114237–114246 (2020), ISSN 0022-0728

Authors :
Hideo Kozima
Source :
Journal of Electroanalytical Chemistry. 897:115551
Publication Year :
2021
Publisher :
Elsevier BV, 2021.

Abstract

The paper “Mechanism of Thermal Runaway as a Cause of Fleischmann-Pons Effect,” by N.E. Galushkin, N.N. Yazvinskaya, D.N. Galushkin, published in the Journal of Electroanalytical Chemistry, 870, pp. 114,237 – 114,246 (2020), ISSN 0022-728, does not contain enough data on the study of nuclear reactions in CF materials that accompany the Fleischmann-Pons effect. Therefore, it is necessary to add an overview of these studies based on the data written in the papers by Fleischmann et al. and data including the paper by Morrey et al. and others obtained in these about 30 years.

Details

ISSN :
15726657
Volume :
897
Database :
OpenAIRE
Journal :
Journal of Electroanalytical Chemistry
Accession number :
edsair.doi...........8a5feab09408ebe4779d838b74599a49
Full Text :
https://doi.org/10.1016/j.jelechem.2021.115551