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Increase Quality of Gaas Monocrystals for Solar Energy Devices Due to Control of Dislocations Using Alhorithm of Detection of Contour Lines of Etching Pits on Surface Waffer Semiconductor

Authors :
Samoilov Andrii
Rylova Nataly
Artemenko Vladislav
Source :
2022 IEEE 4th International Conference on Modern Electrical and Energy System (MEES).
Publication Year :
2022
Publisher :
IEEE, 2022.

Details

Database :
OpenAIRE
Journal :
2022 IEEE 4th International Conference on Modern Electrical and Energy System (MEES)
Accession number :
edsair.doi...........8a2934dc20068afbde8ba5a93abfc1c6
Full Text :
https://doi.org/10.1109/mees58014.2022.10005762