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The 65-nm 16-MB Shared On-Die L3 Cache for the Dual-Core Intel Xeon Processor 7100 Series

Authors :
Szu-Liang Chen
Siufu Chiu
Wei Chen
J. Chang
Venkata Lukka
Ming Huang
G. Leong
John Benoit
Raghuraman Ganesan
Jonathan Shoemaker
Stefan Rusu
Durgesh Srivastava
Source :
IEEE Journal of Solid-State Circuits. 42:846-852
Publication Year :
2007
Publisher :
Institute of Electrical and Electronics Engineers (IEEE), 2007.

Abstract

The 16-way set associative, single-ported 16-MB cache for the Dual-Core Intel Xeon Processor 7100 Series uses a 0.624 mum2 cell in a 65-nm 8-metal technology. Low power techniques are implemented in the L3 cache to minimize both leakage and dynamic power. Sleep transistors are used in the SRAM array and peripherals, reducing the cache leakage by more than 2X. Only 0.8% of the cache is powered up for a cache access. Dynamic cache line disable (Intel Cache Safe Technology) with a history buffer protects the cache from latent defects and infant mortality failures

Details

ISSN :
00189200
Volume :
42
Database :
OpenAIRE
Journal :
IEEE Journal of Solid-State Circuits
Accession number :
edsair.doi...........898e257156786bbce671bdeaeab8f049