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Silicon nanocrystals from high-temperature annealing: Characterization on device level
- Source :
- physica status solidi (a). 210:669-675
- Publication Year :
- 2013
- Publisher :
- Wiley, 2013.
- Subjects :
- 010302 applied physics
Materials science
Annealing (metallurgy)
Nanocrystalline silicon
Solid phase crystallization
Nanotechnology
02 engineering and technology
Surfaces and Interfaces
Quantum dot solar cell
021001 nanoscience & nanotechnology
Condensed Matter Physics
01 natural sciences
Surfaces, Coatings and Films
Electronic, Optical and Magnetic Materials
Monocrystalline silicon
chemistry.chemical_compound
chemistry
Quantum dot
0103 physical sciences
Materials Chemistry
Silicon carbide
Electrical and Electronic Engineering
Silicon nanocrystals
0210 nano-technology
Subjects
Details
- ISSN :
- 18626300
- Volume :
- 210
- Database :
- OpenAIRE
- Journal :
- physica status solidi (a)
- Accession number :
- edsair.doi...........88d256d14882b485c538b2fd74c40bda
- Full Text :
- https://doi.org/10.1002/pssa.201200824