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X-ray microbeam with sputtered-sliced Fresnel zone plate at SPring-8 undulator beamline

Authors :
Hidekazu Takano
Yoshio Suzuki
Yoshiki Kohmura
Masato Yasumoto
Mitsuhiro Awaji
Akihisa Takeuchi
Nagao Kamijo
Shigeharu Tamura
Katsumi Handa
Source :
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. :951-953
Publication Year :
2001
Publisher :
Elsevier BV, 2001.

Abstract

A hard X-ray microbeam created from a sputtered-sliced Fresnel zone plate has been tested at SPring-8 undulator beamline. Focusing properties are evaluated in the X-ray wavelength regions of 0.15– 1.5 A . The measured focal beam size is about 0.6 μm at an X-ray wavelength of 1.4 A . In a scanning microscopy experiment, resolution-test-patterns with 0.2 μm structure are resolved at an X-ray wavelength of 0.45 A .

Details

ISSN :
01689002
Database :
OpenAIRE
Journal :
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
Accession number :
edsair.doi...........88888e48b88f5e00332a6ed8498bcae4
Full Text :
https://doi.org/10.1016/s0168-9002(01)00532-0