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Investigation of threshold current and stress dependence of stacking faults in 4H-SiC

Authors :
Aoi Okada
Johji Nishio
Chiharu Ota
Satoshi Izumi
Mitsuaki Kato
Akira Kano
Akihiro Goryu
Kenji Hirohata
Source :
The Proceedings of Mechanical Engineering Congress, Japan. 2018:J0610104
Publication Year :
2018
Publisher :
Japan Society of Mechanical Engineers, 2018.

Subjects

Subjects :
Threshold current
Materials science
Condensed matter physics
Stress dependence
Stacking

Details

ISSN :
24242667
Volume :
2018
Database :
OpenAIRE
Journal :
The Proceedings of Mechanical Engineering Congress, Japan
Accession number :
edsair.doi...........87e33973c49f34a8ad61bec2cae590e5
Full Text :
https://doi.org/10.1299/jsmemecj.2018.j0610104
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