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New experimental evidence of latent interface-trap buildup in power VDMOSFETs
- Source :
- IEEE Transactions on Nuclear Science. 47:580-586
- Publication Year :
- 2000
- Publisher :
- Institute of Electrical and Electronics Engineers (IEEE), 2000.
-
Abstract
- The paper presents new experimental evidence of the latent interface-trap buildup during annealing of gamma-ray irradiated power VDMOSFETs. We try to reveal the nature of this still ill-understood phenomenon by isothermal annealing, switching temperature annealing and switching bias annealing experiments. Possible explanations of obtained experimental results are discussed in the context of several models for post-irradiation behavior of radiation-induced defects.
Details
- ISSN :
- 15581578 and 00189499
- Volume :
- 47
- Database :
- OpenAIRE
- Journal :
- IEEE Transactions on Nuclear Science
- Accession number :
- edsair.doi...........87777048183b1f1e01186b276b769ffa