Positron implantation profiles in layered samples

The paper presents theoretical and experimental studies of the positron implantation profiles in layered samples. The Monte Carlo simulations performed using the GEANT4 toolkit reveal accumulation of positrons in the denser layer embedded between two less dense layers. That effect is significant not only for low energy positrons at slow monoenergetic positron beams but also for high energy positrons which are emitted from radioactive nuclei in conventional experiments. Measurements of the positron implantation profile into the samples which consist of silver and aluminium foils of different thickness show profile features which correspond well with those simulated by the GEANT4 toolkit for examined cases. We propose to call this phenomenon the accumulation effect of energetic positrons.