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Tomographic Imaging with Single Atom Sensitivity Using Aberration-Corrected STEM

Authors :
S. J. Pennycook
Andrew R. Lupini
Y Peng
K. van Benthem
Source :
Microscopy and Microanalysis. 11
Publication Year :
2005
Publisher :
Oxford University Press (OUP), 2005.

Subjects

Subjects :
Tomographic reconstruction
Materials science
Atom (order theory)
Sensitivity (control systems)
Instrumentation
Molecular physics

Details

ISSN :
14358115 and 14319276
Volume :
11
Database :
OpenAIRE
Journal :
Microscopy and Microanalysis
Accession number :
edsair.doi...........85d649e740c9c65419443e2c05ee5939
Full Text :
https://doi.org/10.1017/s143192760550223x
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