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High-efficiency ultra-thin Cu2ZnSnS4 solar cells by double-pressure sputtering with spark plasma sintered quaternary target
- Source :
- Journal of Energy Chemistry. 61:186-194
- Publication Year :
- 2021
- Publisher :
- Elsevier BV, 2021.
-
Abstract
- In recent years, Cu2ZnSnS4 (CZTS) semiconductor materials have received intensive attention in the field of thin-film solar cells owing to its non-toxic and low-cost elements. In this work, double-pressure sputtering technology is applied to obtain highly efficient and ultra-thin (~450 nm) pure Cu2ZnSnS4 (CZTS) solar cell. Using mixed materials with sulfides and copper powder as a quaternary target via spark plasma sintering (SPS) method and adopting double-layer sputtering (high + low pressure), a highly adhesive and large-grained CZTS thin film is achieved. As a result, the damage to the surface of Mo contact is decreased so that the reflectivity of incident light can be improved. Moreover, the composition of CZTS film was more uniform and the secondary phase separation at the Mo interface was reduced. Therefore, the interface defect state and deep level defect density in corresponding device with double-pressure is reduced and the ratio of depletion thickness to absorption layer thickness can reached to 0.58, which promoted the collection of photogenerated carriers. Finally, an efficiency of 9.3% for ultra-thin (~450 nm) CZTS film solar cell is obtained.
- Subjects :
- Materials science
Energy Engineering and Power Technology
Spark plasma sintering
chemistry.chemical_element
02 engineering and technology
010402 general chemistry
01 natural sciences
law.invention
chemistry.chemical_compound
Sputtering
law
Solar cell
Electrochemistry
CZTS
Thin film
business.industry
Plasma
021001 nanoscience & nanotechnology
Copper
0104 chemical sciences
Fuel Technology
chemistry
Optoelectronics
Adhesive
0210 nano-technology
business
Energy (miscellaneous)
Subjects
Details
- ISSN :
- 20954956
- Volume :
- 61
- Database :
- OpenAIRE
- Journal :
- Journal of Energy Chemistry
- Accession number :
- edsair.doi...........859ff1081598cf34c43f79e5427568d4
- Full Text :
- https://doi.org/10.1016/j.jechem.2021.01.026