Impact of SOI and SI Technologies on EMC of CAN Controller

The CAN controller with silicon on insulator (SOI) CMOS technology is designed to compare the electromagnetic compatibility (EMC) characteristics between SOI and SI technologies. The immunity test bench and the conducted emission test bench are built following direct power injection (DPI) method and 150 Ω method. The test results show that the chip with SOI technology has better immunity; the chip with SI technology has lower emission level.