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A 2.8 μm Pixel for Time of Flight CMOS Image Sensor with 20 ke-Full-Well Capacity in a Tap and 36 % Quantum Efficiency at 940 nm Wavelength

Authors :
Min-Sun Keel
Young-Chan Kim
Daeyun Kim
Youngsun Oh
Seung Chul Shin
Myunghan Bae
Sungyoung Seo
Sung-Ho Choi
Sunju Hong
S.L. Cho
Yeomyung Km
Young-Gu Jin
Taeun Hwang
Jung-Chak Ahn
Kyoung-Min Koh
Ho Woo Park
Yong Hun Kwon
Seok-Ha Lee
Yi-tae Kim
Source :
2020 IEEE International Electron Devices Meeting (IEDM).
Publication Year :
2020
Publisher :
IEEE, 2020.

Abstract

A 2.8μm 4-tap global shutter pixel has been realized for a compact and high-resolution time of flight (ToF) CMOS image sensor. 20,000 e- of high full-well capacity (FWC) per a tap is obtained by employing a supplementary MOS capacitor. 36% of high quantum efficiency (QE) has been achieved by backside scattering technology (BST) and thick silicon process. In addition, demodulation contrast (DC) is improved to 86 % by additional deep photodiode doping process for static potential gradient in a photodiode.

Details

Database :
OpenAIRE
Journal :
2020 IEEE International Electron Devices Meeting (IEDM)
Accession number :
edsair.doi...........83f5add5ab4b5497ee814ef0e56440d6
Full Text :
https://doi.org/10.1109/iedm13553.2020.9371950