The current mirror thermal characterization method and its implementation in a power SOI BJT process

Authors :: J. De Santis
D. Brisbin
Jonggook Kim
Yun Liu
Source :: Bipolar/BiCMOS Circuits and Technology, 2004. Proceedings of the 2004 Meeting.
Publication Year :: 2004
Publisher :: IEEE, 2004.

Subjects :: Materials science
business.industry
Thermal resistance
Bipolar junction transistor
Transistor
Transistor array
Silicon on insulator
Power (physics)
law.invention
Current mirror
law
Electronic engineering
Optoelectronics
business
Current density

Database :: OpenAIRE
Journal :: Bipolar/BiCMOS Circuits and Technology, 2004. Proceedings of the 2004 Meeting
Accession number :: edsair.doi...........8378aa8004f00cec5e1cd5a6658df046

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