Dual-wavelength laser (2780-nm Er,Cr:YSGG and 940-nm diode) investigation regarding surface roughness parameters (Rp in μm) and the surface morphology alterations on different types of dental implants

The primary aim was to investigate the surface roughness parameters (Rp in μm) in four different implants types after dual-wavelength (2780-nm Er,Cr:YSGG and 940-nm diode) laser irradiation. The secondary aim was to investigate which factors influence the morphological modifications. Twenty-four implants were used in this study; six Camlog implants (titanium, O 3.8 × 13 mm), six Dentegris straight implants (titanium, 3.75 O × 11.5 mm), six Neoss proactive straight implants (titanium, O 4.0 × 9 mm) and six TAV dental implants (zirconia, 4 O × 10 mm). An area of 5 mm of the implant surface was treated with G1 (1.5 W/50 Hz) and G2 (1W/50 Hz) of Er,Cr:YSGG and laser setup of diode 940 nm in both groups was 2 W operating with a duty cycle of 0.5. The surface topography of each implant was analysed before and after laser irradiation using laser-scanning microscopy. No significant difference in roughness peak values was observed regarding laser setting or implant type. However, significant differences in roughness mean values were shown up concerning implant type. No signs of thermal defects were observed. Within the limitations of this study, it can be concluded that the dual-wavelength laser Er,Cr:YSGG and diode 940-nm irradiation protocol is a safe method, during implant surface irradiation, regarding implant surface morphology alterations.