Impact of Neutron-Induced SEU in FPGA CRAM on Image-Based Lane Tracking for Autonomous Driving: From Bit Upset to SEFI and Erroneous Behavior

Authors :: Yukio Mitsuyama
Wang Liao
Tomonari Tanaka
Masanori Hashimoto
Source :: IEEE Transactions on Nuclear Science. 69:35-42
Publication Year :: 2022
Publisher :: Institute of Electrical and Electronics Engineers (IEEE), 2022.

Subjects :: Nuclear and High Energy Physics
Bit (horse)
Nuclear Energy and Engineering
business.industry
Computer science
Neutron
Electrical and Electronic Engineering
Tracking (particle physics)
business
Field-programmable gate array
Upset
Image based
Computer hardware

Tools