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Ultimate nano-electronics: New materials and device concepts for scaling nano-electronics beyond the Si roadmap

Authors :
Anabela Veloso
A. Alian
Niamh Waldron
Liesbeth Witters
Roger Loo
Rita Rooyackers
Geert Eneman
S. Sioncke
Ts. Ivanov
Clement Merckling
D. Zhou
G. Boccardi
Jacopo Franco
Hiroaki Arimura
Kathy Barla
Jerome Mitard
Dennis Lin
Aaron Thean
Jianwu Sun
Anne Vandooren
M.A. Pourghaderi
Nadine Collaert
Anne S. Verhulst
Source :
Microelectronic Engineering. 132:218-225
Publication Year :
2015
Publisher :
Elsevier BV, 2015.

Abstract

New materials and device architectures will be needed to extend CMOS scaling.High mobility materials in the channel can boost the performance at scaled supply voltage.Ultimate reduction of power dissipation will require new concepts like Tunnel FET.Vertical devices and 3D stacking allow to further downscale the transistor dimensions. In this work, we will give an overview of the innovations in materials and new device concepts that will be needed to continue Moore's law to the sub-10nm technology nodes. To meet the power and performance requirements high mobility materials in combination with new device concepts like tunnel FETs and gate-all-around devices will need to be introduced. As the density is further increased and it becomes increasingly difficult to put contacts, spacers and gate in the available gate pitch, disruptive integration schemes such as vertical transistors and monolithic 3D integration might lead the way to the ultimate scaling of CMOS.

Details

ISSN :
01679317
Volume :
132
Database :
OpenAIRE
Journal :
Microelectronic Engineering
Accession number :
edsair.doi...........814f5ca598ace544fe612fd9e939de89
Full Text :
https://doi.org/10.1016/j.mee.2014.08.005