An Average Model-Based Transistor Open-Circuit Fault Diagnosis Method for Grid- Tied Single-Phase Inverter

This paper presents an average model-based transistor open-circuit fault diagnosis method for grid-tied single-phase inverters which transfer power bi-directionally. It is easy to detect whereas tricky to identify the faulty transistor, for two different faults may show the same characteristics. In order to solve this problem, the inverter is changed to boost mode after fault is detected, so that the diagnosis variable can show distinguishable characteristics to locate the faulty transistor. The main advantage of this method is that the fault can be diagnosed fast without adding extra circuits. Additionally, it is featured with strong robustness against power change and sampling error. Finally, the effectiveness of the proposed method is verified by experiments.