Quantitative inheritance of yield and associated factors in spring wheat

A diallel cross between five spring wheat cultivars was used to study the inheritance of yield, its components, certain developmental stages and morphological structures above the flag leaf node. In all cases additive genetic variance formed the major part of the genetic variance present. Dominance was, however, present for yield and for three yield components as well as for ear volume, flag leaf length and extrusion length. Dominance effects were also evident in the inheritance of the three stages of development studied.