Cite
NIST High Resolution X-Ray Diffraction Standard Reference Material: SRM 2000
MLA
Donald Windover, et al. “NIST High Resolution X-Ray Diffraction Standard Reference Material: SRM 2000.” AIP Conference Proceedings, Jan. 2009. EBSCOhost, widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsair&AN=edsair.doi...........80d583698e1de53ba04a7ba15ed69b9d&authtype=sso&custid=ns315887.
APA
Donald Windover, David L. Gil, Albert Henins, James P. Cline, Erik M. Secula, David G. Seiler, Rajinder P. Khosla, Dan Herr, C. Michael Garner, Robert McDonald, & Alain C. Diebold. (2009). NIST High Resolution X-Ray Diffraction Standard Reference Material: SRM 2000. AIP Conference Proceedings.
Chicago
Donald Windover, David L. Gil, Albert Henins, James P. Cline, Erik M. Secula, David G. Seiler, Rajinder P. Khosla, et al. 2009. “NIST High Resolution X-Ray Diffraction Standard Reference Material: SRM 2000.” AIP Conference Proceedings, January. http://widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsair&AN=edsair.doi...........80d583698e1de53ba04a7ba15ed69b9d&authtype=sso&custid=ns315887.