Characterization of crystal system of BaPb1−Bi O3 with X-ray diffraction for synchrotron radiation

Crystal symmetry and lattice constants of BaPb1−xBixO3 were analyzed by X-ray diffraction using synchrotron radiation as a light source. Measurements with high resolution could be carried out and crystal system of BaPb1−xBixO3 could be determined clearly. Monoclinic and orthorhombic symmetry were observed in the x range 0.5 ≦ x ≦ 1.0 and 0.0 ≦ x ≦ 0.5, respectively, showing agreement with the electrical conduction behavior and optical reflection property of BaPb1−xBixO3.