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Germanium for advanced CMOS anno 2009: a SWOT analysis

Authors :
Clement Merckling
Jerome Mitard
M.M. Heyns
Roger Loo
Florence Bellenger
B. De Jaeger
Geert Hellings
K. De Meyer
Annelies Delabie
Matty Caymax
Geert Eneman
Eddy Simoen
Marc Meuris
Gang Wang
Source :
2009 IEEE International Electron Devices Meeting (IEDM).
Publication Year :
2009
Publisher :
IEEE, 2009.

Abstract

Germanium has emerged as an exciting alternative material for high-performance scaled CMOS, however not without difficulties. After a review of the state-of-the-art, mainly focusing on two techniques to passivate the channel/dielectric interface, we analyze the strengths (carrier mobility, band gap), and weaknesses (n-type doping, lattice mismatch and BTBT leakage) of Ge for MOSFETs. We also identify some opportunities and the most important threats for the future of germanium.

Details

Database :
OpenAIRE
Journal :
2009 IEEE International Electron Devices Meeting (IEDM)
Accession number :
edsair.doi...........8043870c4bc8571b96067b73e0dc506d
Full Text :
https://doi.org/10.1109/iedm.2009.5424320