Back to Search
Start Over
Germanium for advanced CMOS anno 2009: a SWOT analysis
- Source :
- 2009 IEEE International Electron Devices Meeting (IEDM).
- Publication Year :
- 2009
- Publisher :
- IEEE, 2009.
-
Abstract
- Germanium has emerged as an exciting alternative material for high-performance scaled CMOS, however not without difficulties. After a review of the state-of-the-art, mainly focusing on two techniques to passivate the channel/dielectric interface, we analyze the strengths (carrier mobility, band gap), and weaknesses (n-type doping, lattice mismatch and BTBT leakage) of Ge for MOSFETs. We also identify some opportunities and the most important threats for the future of germanium.
Details
- Database :
- OpenAIRE
- Journal :
- 2009 IEEE International Electron Devices Meeting (IEDM)
- Accession number :
- edsair.doi...........8043870c4bc8571b96067b73e0dc506d
- Full Text :
- https://doi.org/10.1109/iedm.2009.5424320