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Three-dimensional particle tracking by pixel difference method of optical path length based on digital holographic microscopy

Authors :
Yanan Zeng
Xinyu Chang
Xiaotang Hu
Xiaodong Hu
Hai Lei
Source :
Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena. 33:051808
Publication Year :
2015
Publisher :
American Vacuum Society, 2015.

Abstract

Particle tracking with nanometer resolution is of growing importance in microrheology, microfluidics, and life science. Pixel difference method of optical path length (OPL) is a proposed novel digital holographic microscopy (DHM) method to achieve 3D particle tracking utilizing configuration of an off-axis digital holographic microscope. Pixel difference methodology focuses on variation of the OPL of two fixed pixel points in the recording plane. In this method, the second derivative of OPL difference is a tracking tag. Instead of calculating two dimensional images in classical DHM, pixel difference method of OPL only concerns trend of one-dimensional data series. In this sense, the tracking efficiency, which is important in dynamic investigation, is improved. Pixel difference of OPL, with nanometer-scale resolution, is presented as applicable in particle tracking by tracking the beads fixed on the piezoelectric stage with nanometer precision.

Details

ISSN :
21662754 and 21662746
Volume :
33
Database :
OpenAIRE
Journal :
Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena
Accession number :
edsair.doi...........8017fd0919a9ff23b6a675e6aed0f445
Full Text :
https://doi.org/10.1116/1.4929690