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Three-dimensional particle tracking by pixel difference method of optical path length based on digital holographic microscopy
- Source :
- Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena. 33:051808
- Publication Year :
- 2015
- Publisher :
- American Vacuum Society, 2015.
-
Abstract
- Particle tracking with nanometer resolution is of growing importance in microrheology, microfluidics, and life science. Pixel difference method of optical path length (OPL) is a proposed novel digital holographic microscopy (DHM) method to achieve 3D particle tracking utilizing configuration of an off-axis digital holographic microscope. Pixel difference methodology focuses on variation of the OPL of two fixed pixel points in the recording plane. In this method, the second derivative of OPL difference is a tracking tag. Instead of calculating two dimensional images in classical DHM, pixel difference method of OPL only concerns trend of one-dimensional data series. In this sense, the tracking efficiency, which is important in dynamic investigation, is improved. Pixel difference of OPL, with nanometer-scale resolution, is presented as applicable in particle tracking by tracking the beads fixed on the piezoelectric stage with nanometer precision.
- Subjects :
- Physics
Microscope
Pixel
business.industry
Process Chemistry and Technology
Resolution (electron density)
Holography
Tracking (particle physics)
Surfaces, Coatings and Films
Electronic, Optical and Magnetic Materials
law.invention
Optics
law
Materials Chemistry
Digital holographic microscopy
Electrical and Electronic Engineering
business
Instrumentation
Optical path length
Second derivative
Subjects
Details
- ISSN :
- 21662754 and 21662746
- Volume :
- 33
- Database :
- OpenAIRE
- Journal :
- Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena
- Accession number :
- edsair.doi...........8017fd0919a9ff23b6a675e6aed0f445
- Full Text :
- https://doi.org/10.1116/1.4929690