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Inhomogeneous electronic structure of copper phthalocyanine film measured with microspot photoemission spectroscopy
- Source :
- Applied Physics Letters. 85:3584-3586
- Publication Year :
- 2004
- Publisher :
- AIP Publishing, 2004.
-
Abstract
- We have applied photoemission microspectroscopy to copper phthalocyanine film grown on a polycrystalline copper with a lateral resolution of 0.3μm and an energy resolution of 30meV. The photoemission band due to the highest occupied molecular orbital peaked at the binding energy of either 1.6 or 1.2eV depending on the sample positions, while the work functions were 4.3 and 4.5eV for the respective positions. The band was intense when the binding energy was low. The results demonstrate that a large inhomogeneity exists in the interface electronic structure.
Details
- ISSN :
- 10773118 and 00036951
- Volume :
- 85
- Database :
- OpenAIRE
- Journal :
- Applied Physics Letters
- Accession number :
- edsair.doi...........7fd46c1418e57e8439c9dea1737d3428
- Full Text :
- https://doi.org/10.1063/1.1808494