A Complete Characterization of Samples Using Multivariate Statistical Analysis of 3Dimensional MCs+ ToF-SIMS Data

Authors :: M Keenan
Vincent S. Smentkowski
Source :: Microscopy and Microanalysis. 17:1462-1463
Publication Year :: 2011
Publisher :: Oxford University Press (OUP), 2011.
Abstract: Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Subjects :: Multivariate statistics
Materials science
Statistics
Multivariate statistical
Instrumentation
Characterization (materials science)

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