Cite
Novel analytical model for the determination of grain size distributions in nanocrystalline materials with low lattice microstrains by X-ray diffractometry
MLA
Angel Ortiz, et al. “Novel Analytical Model for the Determination of Grain Size Distributions in Nanocrystalline Materials with Low Lattice Microstrains by X-Ray Diffractometry.” Acta Materialia, vol. 54, Jan. 2006, pp. 1–10. EBSCOhost, https://doi.org/10.1016/j.actamat.2005.08.018.
APA
Angel Ortiz, Francisco Luis Cumbrera Hernandez, Francisco Cumbrera, & Florentino Sánchez Bajo. (2006). Novel analytical model for the determination of grain size distributions in nanocrystalline materials with low lattice microstrains by X-ray diffractometry. Acta Materialia, 54, 1–10. https://doi.org/10.1016/j.actamat.2005.08.018
Chicago
Angel Ortiz, Francisco Luis Cumbrera Hernandez, Francisco Cumbrera, and Florentino Sánchez Bajo. 2006. “Novel Analytical Model for the Determination of Grain Size Distributions in Nanocrystalline Materials with Low Lattice Microstrains by X-Ray Diffractometry.” Acta Materialia 54 (January): 1–10. doi:10.1016/j.actamat.2005.08.018.