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Coexistence of the CuPt type ordering and the fine contrast modulation in InGaP/GaAs layers depending on the substrate misorientation

Authors :
Joan Ramon Morante
F. Peiró
Angel Dieguez
A. Cornet
Source :
Defect Recognition and Image Processing in Semiconductors 1997
Publication Year :
2017
Publisher :
Routledge, 2017.

Details

Database :
OpenAIRE
Journal :
Defect Recognition and Image Processing in Semiconductors 1997
Accession number :
edsair.doi...........7f0448ab49ee55488d1b763e7e333670