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Coexistence of the CuPt type ordering and the fine contrast modulation in InGaP/GaAs layers depending on the substrate misorientation
- Source :
- Defect Recognition and Image Processing in Semiconductors 1997
- Publication Year :
- 2017
- Publisher :
- Routledge, 2017.
Details
- Database :
- OpenAIRE
- Journal :
- Defect Recognition and Image Processing in Semiconductors 1997
- Accession number :
- edsair.doi...........7f0448ab49ee55488d1b763e7e333670