Back to Search
Start Over
Analysis of Atomic Arrangement at 3C-SiC/Si(001) Interface by Aberration-Corrected Transmission Electron Microscopy
- Source :
- Extended Abstracts of the 2011 International Conference on Solid State Devices and Materials.
- Publication Year :
- 2011
- Publisher :
- The Japan Society of Applied Physics, 2011.
Details
- Database :
- OpenAIRE
- Journal :
- Extended Abstracts of the 2011 International Conference on Solid State Devices and Materials
- Accession number :
- edsair.doi...........7ddb322e082b67d0adbd837c78278707
- Full Text :
- https://doi.org/10.7567/ssdm.2011.m-9-3