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The Concept of Safe Operating Area for Gate Dielectrics: the SiC/SiO2 Case Study
- Source :
- 2023 IEEE International Reliability Physics Symposium (IRPS).
- Publication Year :
- 2023
- Publisher :
- IEEE, 2023.
Details
- Database :
- OpenAIRE
- Journal :
- 2023 IEEE International Reliability Physics Symposium (IRPS)
- Accession number :
- edsair.doi...........7d8df0bd51893bfc6b4532399c3966f6