Using Visible Laser-Based Raman Spectroscopy to Identify the Surface Polarity of Silicon Carbide

MLA

Yi-Chuan Tseng, et al. “Using Visible Laser-Based Raman Spectroscopy to Identify the Surface Polarity of Silicon Carbide.” The Journal of Physical Chemistry C, vol. 120, Aug. 2016, pp. 18228–34. EBSCOhost, https://doi.org/10.1021/acs.jpcc.6b03713.

APA

Yi-Chuan Tseng, Dai-Liang Ma, Bang-Ying Yu, Bo-Cheng Lin, Yu-Chia Cheng, Hsuen-Li Chen, & Yang-Chun Lee. (2016). Using Visible Laser-Based Raman Spectroscopy to Identify the Surface Polarity of Silicon Carbide. The Journal of Physical Chemistry C, 120, 18228–18234. https://doi.org/10.1021/acs.jpcc.6b03713

Chicago

Yi-Chuan Tseng, Dai-Liang Ma, Bang-Ying Yu, Bo-Cheng Lin, Yu-Chia Cheng, Hsuen-Li Chen, and Yang-Chun Lee. 2016. “Using Visible Laser-Based Raman Spectroscopy to Identify the Surface Polarity of Silicon Carbide.” The Journal of Physical Chemistry C 120 (August): 18228–34. doi:10.1021/acs.jpcc.6b03713.